泰克Tektronix 高压差分探头TDP1000

　　The TDP1000, TDP0500, and P6251 High-voltage Differential Probes provide excellent high-speed electrical and mechanical performance required for today's Switch Mode Power Supply (SMPS), CAN/LIN Bus, and high-speed digital system designs.

Key performance specifications

　　◆ 1 GHz and 500 MHz probe bandwidth

　　◆ <1 pF differential input capacitance

　　◆ 1 MΩ differential input resistance

　　◆ ±42 v (DC + pk AC) differential input voltage

　　◆ >18 dB CMRR (at 250 MHz 50X attenuation)

Key features

　　◆ Outstanding electrical performance

　　       ●Selectable bandwidth-limiting filters

　　       ●DC reject

　　◆ Versatile DUT connectivity

　　       ●Small compact probe head for probing small geometry circuit elements

　　       ●Straight pin, square pin, solder down, variable pitch standard accessories

　　       ●Robust design for reliability

　　◆ Easy to use

　　       ●Provides automatic units scaling and readout on the oscilloscope display

　　       ●TDP1000, TDP0500

　　          Connect directly to oscilloscopes with the TekVPI™ probe interface

　　          Easy access to scope-displayed probe menu for probe setup control and operating status information

　　          Remote GPIB/USB probe control through the oscilloscope

　　          AutoZero – zeros out output offset

　　       ●P6251

　　          Connect directly to the TekProbe™ interface oscilloscopes, or to TekConnect® oscilloscopes using TCA-BNC adapter

Applications

　　◆ High-speed switch mode power supply design

　　◆ CAN/LIN bus design

　　◆ Digital design and characterization

　　◆ Manufacturing engineering test

　　◆ Research and development

High-voltage differential probes

　　The TDP1000, TDP0500, and P6251 High-voltage Differential Probes are specifically designed for use with and direct connection to Tektronix oscilloscopes with either the TekVPI™ probe interface, or TekProbe BNC Interface. These probes achieve high-speed signal acquisition and measurement fidelity by solving three traditional measurement challenges:

　　◆ Outstanding Electrical Performance

　　◆ Versatile Device-Under-Test Connectivity

　　◆ Ease of Use